Scanning Electron Microscope (SEM)

Brand : Hitachi

Performance & Power in a Flexible Platform

 Hitachi High-Tech's scanning electron microscopes SU3800/SU3900 deliver both operability and expandability. The operator can automate many operations and efficiently utilize their high performance. The SU3900 is equipped with a large multipurpose specimen chamber to accommodate observation of large samples.

 1. Substantially Larger Specimen Chamber Accommodates Oversized and Heavy Samples

§ Robust Stage for Flexibility in Sample Size, Shape, and Weight

- The specimen exchange sequence prevents potential damage to the system or the sample.

- Exchange the specimens without venting the specimen chamber, improving throughput.

- Increase sample manipulation with Stage Free Mode*.

- The Chamber Scope enhances the safety of stage movements*.

§ Increased Viewing Area—SEM MAP Expands the Boundaries of Sample Navigation

- Integrated in-chamber camera display

- Easily navigate the entire observable area

- Detector-oriented rotation

 2. Evolution of the Market—Improved Automatic Functions for Operators of Any Skill Level

§ Multiple Modes of Operation

§ Automatic Functions for Operators of Any Skill Level

- Improved auto algorithms—3X faster (compared with the Hitachi Model S-3700N)

- Improved auto focus function

- Features of our proprietary Intelligent Filament Technology (IFT):

§ Multi Zigzag enables wide-area observation across multiple areas.

§ Report Creator generates reports of acquired data.

3. Integrated Solutions for Various Applications

§ A Variety of Accessories Mountable onto Any of the 20 Ports in the Innovative SU3900 Specimen Chamber.

§ SEM/EDS Integration System*

§ High Sensitivity Detectors Supporting All Observation Requirements

- CL observation Using UVD*

- Segmented BSED allows for visualizing composition and topography.

§ STEM Holder

§ 3D Modeling Software: Hitachi map 3D*

§ Image Processing, Measurement, and Analysis Software: Image-Pro® for Hitachi

*optional